Hitlist - Class : 543.422.8
Hitlist - Class : 543.422.8

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Reserve a copy 1. Advances in X-ray analysis. Vol. 19 [... proceedings of the twenty-fourth Annual Conference on Applications of X-ray Analysis ...] (1975)
Conference on Applications of X-ray Analysis; Gould, R.W.; University of Denver. Denver Research Institute
ISBN: 0840313837
Copies: 1
Conference on Applications of X-ray Analysis. Denver, (24th : 1975) (Conference)543.422.8Books/MonographsAdd To Basket
Reserve a copy 2. Advances in x-ray analysis. Volume 17 [Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973] (1974)
Conference on Applications of X-ray Analysis; Barrett, C.S.
ISBN: 0306381176
Copies: 1
Conference on Applications of X-ray Analysis. Denver, (22nd : 1973) (Conference)543.422.8Books/MonographsAdd To Basket
Reserve a copy 3. Advances in x-ray analysis. Volume 18 [Proceedings of the Twenty-Third Annual Conference on Applications of X-Ray Analysis held in Denver, August 7-9, 1974] (1975)
Conference on Applications of X-ray Analysis; Barrett, C.S.
ISBN: 0306381184
Copies: 1
Conference on Applications of X-ray Analysis. Denver, (23nd : 1974) (Conference)543.422.8Books/MonographsAdd To Basket
Reserve a copy 4. Analyse quantitative des roches par la methode de fluorescence X : Ptie. I L'importance du rayonnement X de diffusion pour l'etalonnage par K. Weber (1969)
Weber, K.; Euratom
ISBN: X780096052
Copies: 1
Weber, K. (Author)552.08Books/MonographsAdd To Basket
Reserve a copy 5. Counters for X-ray analysis / by P. H. Dowling ... [et al.]. The "Norelco" X-ray diffractometer / by W. Parrish, E. A. Hamacher and K. Lowitzsch. X-ray intensity measurements with counter tubes / by W. Parrish. X-ray spectrochemical analysis / by W. Parrish (1957)
Dowling, P. H.; Parrish, William; Hamacher, E. A.; Lowitzsch, K.; Philips' Gloeilampenfabrieken
Copies: 1
Dowling, P. H. (Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 6. Detection of traces of metals in oil with X-ray spectrography. Quantitative determination of the toria-content of tungsten metal powders by X-ray diffraction. Thickness measurement of chromium platings on steel. Examination of pigment. Special collimators for Debije-Scherrer cameras. Investigation of the origin of fires by means of X-ray diffraction. Determination of magnesium in aluminium. Identification of silicon in iron ore. Qualtitative analysis of glass. Determination of silicon in steel (1956-1959)
Philips' Gloeilampenfabrieken
Copies: 1
Philips' Gloeilampenfabrieken (Corporate Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 7. The determination of trace amounts of niobium, yttrium, zirconium, rubidium and strontium in rock powders by x-ray spectrometry ([1981])
Bevan, S.A.; Griffiths, J.M.
ISBN: X780039407
Copies: 4
Bevan, S.A. (Author)552.08Books/MonographsAdd To Basket
Reserve a copy 8. Elemental X-ray analysis of materials : EXAM methods (1972)
Russ, J.C.
ISBN: X50057952X
Copies: 1
Russ, J.C. (Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 9. Elemental Xray analysis of materials : EXAM methods (1972)
Russ, John C.; Walsh, Charles J.
Copies: 1
Russ, John C. (Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 10. Frame C : a compact procedure for quantitative energy-dispersive electron probe x-ray analysis (1980)
Myklebust, R.L.; Fiori, C.E.; Heinrich, K.F.J.
ISBN: X780117408
Copies: 2
Myklebust, R.L. (Author)85/18Books/MonographsAdd To Basket
Reserve a copy 11. Index to the literature on X-ray spectrographic analysis. Part I, 1913-1957 (1961)
American Society for Testing Materials
Copies: 1
American Society for Testing Materials (Corporate Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 12. List of publications on X-ray analytical subjects (1968)
Philips' Gloeilampenfabrieken
Copies: 1
Philips' Gloeilampenfabrieken (Corporate Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 13. Micro-XRF studies of sediment cores : applications of a non-destructive tool for the environmental sciences (2015)
Croudace, I.W.; Rothwell, R.G.
Copies: 2
Croudace, I.W. (Editor)543.422.8Books/MonographsAdd To Basket
Reserve a copy 14. Principles and practice of X-ray spectrometric analysis (2nd ed)
Bertin, E.
ISBN: 0306308096
Copies: 1
Bertin, E. (Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 15. Quantitative x-ray spectrometry (c1981)
Jenkins, R.; Gould, R.W.; Gedcke, D.; Gould, R W; Gedcke, D; Jenkins, R
ISBN: 0824712668
Copies: 2
Jenkins, R. (Author)543.422.8.062Books/MonographsAdd To Basket
Reserve a copy 16. Review of literature (1963)
Philips' Gloeilampenfabrieken
Copies: 1
Philips' Gloeilampenfabrieken (Corporate Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 17. Review of literature : XRFS (3rd ed.) (1966)
Philips' Gloeilampenfabrieken
Copies: 1
Philips' Gloeilampenfabrieken (Corporate Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 18. Scanning electron microscopy and X-ray microanalysis : a text for biologists, materials scientists, and geologists
Goldstein, J.I.
ISBN: 030640768X
Copies: 2
Goldstein, J.I. (Author)537.533.72Books/MonographsAdd To Basket
Reserve a copy 19. Tabellen zur Rontgen-Emissions- und Absorptions-Analyse (1959)
Sagel, K.
Copies: 1
Sagel, K. (Konrad) (Author)543.422.8Books/MonographsAdd To Basket
Reserve a copy 20. Worked examples in x-ray analysis (1st ed.) (1970)
Jenkins, R.; Vries, J.L. de
Copies: 2
Jenkins, R. (Author)543.422.8Books/MonographsAdd To Basket
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